Measurement professionals to meet at CMSC 2019

The Coordinate Metrology Society Conference features 21 expert-authored technical papers and presentations. (Courtesy: CMSC)

The Coordinate Metrology Society® (CMS) will host a slate of 21 original, expert-authored white papers and presentations to be delivered at the 2019 Coordinate Metrology Society Conference (CMSC), which will cover research, innovations, best practices, and substantive application successes. Michael Raphael, president of Direct Dimensions and a veteran metrologist, will give the keynote address. The annual gathering is in Orlando, Florida, July 22 – 26, 2019.

In its 35th year, the CMS has long served the specialized needs of 3D measurement/inspection professionals and scientists worldwide, now including both the portable and traditional coordinate measuring machine (CMM) communities. The five-day event provides a welcoming, educational atmosphere for attendees and exhibitors to share experiences, challenges, research, concepts, and theory.

This event will mark the 35th year of the premiere conference dedicated to portable and traditional coordinate measuring machine (CMM) measurement professionals. Raphael will address the CMS  with the presentation “The Future of 3D Metrology.” Raphael will draw upon his 30-plus years of experience to cover the metrology field and explore the evolution of 3D measurement solutions, scanning technologies, and digital modeling solutions for the wide range of applications and industries.

Raphael got his start in the field of 3D metrology in 1985 as an engineer responsible for solving aerospace manufacturing problems. He founded Direct Dimensions, Inc. (DDI) in 1995 to provide comprehensive 3D technical services, product representations, sales, and support for all types of 3D scanning, imaging, and dimensional measurement solutions.

The company employs nearly 30 technical and professional employees and performs hundreds of 3D scanning and modeling projects every year. He graduated from Virginia Tech with a BS degree in engineering science and mechanics, followed by a Master of Engineering Administration degree from George Washington University.

CMSC will continute its slate of original content and broad selection of topics from emerging trends to the application of metrology techniques and technology. Subject matter is extensive, from the user-friendly “How to Get the Most Accuracy out of Your PCMM” to the high-level presentation “Tracker Kinematics and Uncertainty Using Quaternion.” Other experts share experiences such as “DKIST’s Journey of Using a Laser Tracker,” “Dynamic 3D Measurement of a Deployable Gossamer Antenna Structure Via Multi-Camera Photogrammetry in Zero Gravity,” and “Creating a New Concept in Performance-Built Sport Catamarans.” Application-level presentations will cover topics such as “Using Coordinate Measurement Machines To Shorten Time To Market For Aerospace Engine Components” and “Thickness Inspection of Composite Parts.”

Designed to empower the rapidly evolving measurement profession, the conference attracts metrology practitioners, quality control managers, manufacturing executives, scientists, students, and educators — hailing from prominent science/research laboratories, educational institutions, and industries such as aerospace, satellite, automotive, shipbuilding, power generation, and general engineering. Attendees are offered a wide range of educational experiences from technical presentations to the CMSC Exhibition Hall, home of the ever-popular Measurement and Education Zones. The CMSC program rounds out with certification examinations, workshops, training courses, networking events, an optional local tour, and post-conference access to all technical papers and presentation materials.