CMS announces call for papers

The Coordinate Metrology Society’s (CMS) 34th annual Coordinate Metrology Society Conference (CMSC) will be July 23-27, 2018, in Reno, Nevada, and the group has issued a call for papers. The CMS is the eminent membership association for measurement professionals worldwide. For the first time, the organization is opening its call for papers to the Coordinate Measurement Machine (CMM) community, in addition to its portable measurement systems society. The CMS encourages abstract submissions that explore diverse applications of 3D metrology to improve processes, productivity, and the user experience. Since 1984, industry leaders have contributed more than 500 high-level technical papers and presentations to the CMSC portfolio, the most comprehensive repository of metrology knowledge and information.

After the conference, the CMS Executive Committee will select the top technical papers presented at CMSC 2018 for publication in the prestigious Journal of the CMSC. (Courtesy: CMSC)

The Coordinate Metrology Society encourages papers and presentations that cover research and development driving the future of metrology such as the Smart Factory, 3D printing, artificial intelligence (AI), automation and manufacturing cells, and other trends that unlock the potential of 3D metrology technologies. Submissions must be original, expert-level contributions from metrology practitioners working in the portable and CMM metrology field. Technical papers can cover all aspects of metrology competencies gained from research and development, best practices, technology benchmarks, and innovative use cases exploring the adoption or adaption of metrology solutions for problem solving or process control. Commercial content is not accepted by the CMS.

The deadline for abstract submissions for technical papers and presentations is March 9, 2018. The CMS Executive Committee peer reviews each abstract and, if selected, the speaker will receive a Notification of Acceptance on April 6, 2018. As a bonus, conference registration and membership fees are waived for individual speakers presenting at the conference. In the case of multiple authors, the CMS will waive one conference registration and membership fee. Contact Daniel Sawyer, Scott Sandwith, or Michelle Edwards, Technical Presentations Coordinators, at for more information.  

After the conference, the CMS Executive Committee will select the top technical papers presented at CMSC 2018 for publication in the prestigious Journal of the CMSC. The technical journal provides additional coverage of the published work to an even larger global audience. CMS members in good standing can also access the technical papers and presentations via the CMSC website. Authors and researchers are also encouraged to cite CMSC technical papers if referenced in their own technical papers.

The Coordinate Metrology Society dedicates itself to serving the education and career needs of expert and novice metrologists. An impressive array of authoritative white papers and presentations were delivered at its 2017 conference, covering topics from close-range photogrammetry in space to metrology-guided wing join automation to point cloud measurements on a CMM artifact using a laser scanner. Speakers hailed from NASA (Johnson Space Center), Triumph Aerostructures (Vought Aircraft Division), IK4-TEKNIKER (Spain), Idaho Virtualization Laboratory, Lawrence Berkeley National Laboratory, Brookhaven National Laboratory, National Institute for Standards and Technology (NIST), National Physical Laboratory (NPL- UK), Los Alamos National Laboratory, Argonne National Laboratory, UNC Charlotte, University College London, Academy of Opto-electronics, Chinese Academy of Sciences, Tianjin University, and other leaders in the field.

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